Abstract
We present a new phase-sweep method for characterizing laser-induced complex dielectric gratings. This characterization requires four parameters: the amplitudes and the spatial phases of both the refractive-index and the absorption components. We apply this phase-sweep method to study a complex polarizability grating in a nominally undoped cubic photorefractive Bi12TiO20 crystal. We determine the polarizability difference αfe between a full and an empty photoexcitable deep trap at 633 nm in Bi12TiO20 to be (2.5 − 8.3i ± 1.0 ± 3.3i) × 10−40 F m2 in SI units or (2.3 − 7.5i ± 0.9 ± 3.0i) × 10−24 cm3 in Gaussian units.
© 1994 Optical Society of America
Full Article | PDF ArticleMore Like This
Ping Xia, J. M. C. Jonathan, J. P. Partanen, and R. W. Hellwarth
Opt. Lett. 18(21) 1780-1782 (1993)
K. Buse, R. Pankrath, and E. Krätzig
Opt. Lett. 19(4) 260-262 (1994)
Skip Williams, Larry A. Rahn, Phillip H. Paul, Jon W. Forsman, and Richard N. Zare
Opt. Lett. 19(21) 1681-1683 (1994)