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  • Vol. 20, Iss. 10 — May. 15, 1995
  • pp: 1110–1112

Measurements of the tensor properties of third-order nonlinearities in wide-gap semiconductors

Todd D. Krauss, Jinendra K. Ranka, Frank W. Wise, and Alexander L. Gaeta  »View Author Affiliations


Optics Letters, Vol. 20, Issue 10, pp. 1110-1112 (1995)
http://dx.doi.org/10.1364/OL.20.001110


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Abstract

We extend the z-scan technique to provide for measurements of the sign and the magnitude of all the independent components of χ(3) for isotropic and cubic-symmetry materials. This technique is used to measure the dispersion of the tensor components of the real and the imaginary parts of χ(3) for various wide-gap semiconductor materials by use of femtosecond laser pulses. Our measurements of the polarization dichroism of the nonlinear-index and two-photon absorption coefficients are in fair agreement with recent theoretical calculations; however, substantial discrepancies exist between the measured and predicted values for the corresponding anisotropy parameters.

© 1995 Optical Society of America

History
Original Manuscript: January 12, 1995
Published: May 15, 1995

Citation
Todd D. Krauss, Jinendra K. Ranka, Frank W. Wise, and Alexander L. Gaeta, "Measurements of the tensor properties of third-order nonlinearities in wide-gap semiconductors," Opt. Lett. 20, 1110-1112 (1995)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-20-10-1110


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