We extend the z-scan technique to provide for measurements of the sign and the magnitude of all the independent components of χ(3) for isotropic and cubic-symmetry materials. This technique is used to measure the dispersion of the tensor components of the real and the imaginary parts of χ(3) for various wide-gap semiconductor materials by use of femtosecond laser pulses. Our measurements of the polarization dichroism of the nonlinear-index and two-photon absorption coefficients are in fair agreement with recent theoretical calculations; however, substantial discrepancies exist between the measured and predicted values for the corresponding anisotropy parameters.
© 1995 Optical Society of America
Original Manuscript: January 12, 1995
Published: May 15, 1995
Todd D. Krauss, Jinendra K. Ranka, Frank W. Wise, and Alexander L. Gaeta, "Measurements of the tensor properties of third-order nonlinearities in wide-gap semiconductors," Opt. Lett. 20, 1110-1112 (1995)