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Optics Letters

Optics Letters


  • Vol. 20, Iss. 17 — Sep. 1, 1995
  • pp: 1821–1823

Z-scan measurement technique for non-Gaussian beams and arbitrary sample thicknesses

Robert E. Bridges, George L. Fischer, and Robert W. Boyd  »View Author Affiliations

Optics Letters, Vol. 20, Issue 17, pp. 1821-1823 (1995)

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We demonstrate a new Z-scan measurement technique that permits the use of non-Gaussian beams and thick, as well as thin, samples. We expect that this technique will make possible the measurement of optical nonlinearities by the use of lasers that previously would have been unsuitable for this purpose, because of either inadequate beam quality or inadequate power. Another advantage of this technique is that it does not require detailed knowledge of the temporal characteristics of the laser pulse that is used.

© 1995 Optical Society of America

Original Manuscript: April 17, 1995
Published: September 1, 1995

Robert E. Bridges, George L. Fischer, and Robert W. Boyd, "Z-scan measurement technique for non-Gaussian beams and arbitrary sample thicknesses," Opt. Lett. 20, 1821-1823 (1995)

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