Using a vibrating opaque metallic tip, which periodically and locally modifies the electromagnetic field distribution of a diffraction spot focused onto a sample surface through a microscope objective lens, we have observed optical resolution better than the diffraction limit both with topographical features and with purely optical ones. This procedure simultaneously generates a reflection-mode near-field optical signal and a tapping-mode atomic force microscope signal and can therefore map independently the topography and the optical properties of a specimen.
© 1995 Optical Society of America
Original Manuscript: April 11, 1995
Published: September 15, 1995
R. Bachelot, P. Gleyzes, and A. C. Boccara, "Near-field optical microscope based on local perturbation of a diffraction spot," Opt. Lett. 20, 1924-1926 (1995)