Ellipsometers permit the measurement of the phase between s and p polarizations with high accuracy. However, for some applications such high accuracy is not required. A configuration based on a grating interferometer is an attractive solution that permits, with the use of a polarizer and a ferroelectric liquid-crystal retarder, the measurement of the phase between s and p polarizations after diffraction by gratings. This device can find applications in the field of optical fiber sensors.
© 1995 Optical Society of America
Original Manuscript: June 26, 1995
Published: November 1, 1995
H. Giovannini and H. Akhouayri, "Interferometric configuration based on a grating interferometer for the measurement of the phase between TE and TM polarizations after diffraction by gratings," Opt. Lett. 20, 2255-2257 (1995)