Abstract
Ellipsometers permit the measurement of the phase between s and
p polarizations with high accuracy. However, for some
applications such high accuracy is not required. A configuration based on a
grating interferometer is an attractive solution that permits, with the use of a
polarizer and a ferroelectric liquid-crystal retarder, the measurement of the
phase between s and p polarizations after
diffraction by gratings. This device can find applications in the field of
optical fiber sensors.
© 1995 Optical Society of America
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