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Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

  • Vol. 20, Iss. 4 — Feb. 15, 1995
  • pp: 419–421

Compact in-line interferometer for low-coherence reflectometry

J. M. Schmitt  »View Author Affiliations


Optics Letters, Vol. 20, Issue 4, pp. 419-421 (1995)
http://dx.doi.org/10.1364/OL.20.000419


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Abstract

An interferometer with an efficient confocal layout is described. Similar in structure to a folded Linnik microscope, the interferometer employs broadband illumination to improve rejection of out-of-focus light. A prototype reflectometry system based on the new interferometer achieved an axial resolution of less than 10 μm within a probing depth of 1 mm in samples containing particulate scatterers and specularly reflecting objects. Options for mechanical and electronic scanning are discussed.

© 1995 Optical Society of America

History
Original Manuscript: August 3, 1994
Published: February 15, 1995

Citation
J. M. Schmitt, "Compact in-line interferometer for low-coherence reflectometry," Opt. Lett. 20, 419-421 (1995)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-20-4-419


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