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Optics Letters

Optics Letters


  • Vol. 20, Iss. 9 — May. 1, 1995
  • pp: 1074–1076

Maximum-entropy optical spectrum analyzer

D. D. Marcenac and J. E. Carroll  »View Author Affiliations

Optics Letters, Vol. 20, Issue 9, pp. 1074-1076 (1995)

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A new type of spectrometer, with no movable parts, no optical sources, and no precision engineering, is demonstrated by the use of computer interpretation of interference patterns. Currently it has a resolution sufficient to determine the optical spectrum of a two-moded distributed-feedback laser with 2-nm mode spacing. The spectrometer operates by transmitting the laser light through two pinholes to generate an interference pattern in the far field. The interference pattern is captured with an infrared camera and is transferred to a computer. The spectrum of the light is extracted from this interference pattern by the maximum-entropy method of spectral estimation.

© 1995 Optical Society of America

Original Manuscript: October 24, 1994
Published: May 1, 1995

D. D. Marcenac and J. E. Carroll, "Maximum-entropy optical spectrum analyzer," Opt. Lett. 20, 1074-1076 (1995)

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  1. J. P. Burg, in Proceedings of 37th Meeting of the Society of Exploration Geophysicists (Society of Exploration Geophysicists, Tulsa, Okla., 1967), p. 375 (also reprinted in Ref. 2).
  2. D. G. Childers, Modern Spectrum Analysis (Institute of Electrical and Electronics Engineers, New York, 1978), p. 17.
  3. S. M. Kay, S. L. Marple, Proc. IEEE 69, 1380 (1981). [CrossRef]
  4. G. F. Engen, IEEE Trans. Microwave Theory Tech. MTT-25, 1070 (1977).

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