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Optics Letters

Optics Letters


  • Vol. 20, Iss. 9 — May. 1, 1995
  • pp: 1077–1079

High-optical-density out-of-band spectral transmittance measurements of bandpass filters

Z. M. Zhang, L. M. Hanssen, and R. U. Datla  »View Author Affiliations

Optics Letters, Vol. 20, Issue 9, pp. 1077-1079 (1995)

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We have measured the out-of-band transmittance (attenuation) for several narrow-band filters using two Fourier-transform infrared spectrometers in the wavelength range of 2–25 μm. Band-rejection filters are used to eliminate the power transmitted in the main band of the filter under investigation. Neutral-density filters are used for the reference measurement to reduce the effect of nonlinearity. Results from different optical arrangements are compared and discussed. This study demonstrates the feasibility of using Fourier-transform infrared instruments to measure a spectral transmittance of 10−6.

© 1995 Optical Society of America

Original Manuscript: November 3, 1994
Published: May 1, 1995

Z. M. Zhang, L. M. Hanssen, and R. U. Datla, "High-optical-density out-of-band spectral transmittance measurements of bandpass filters," Opt. Lett. 20, 1077-1079 (1995)

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  1. D. L. Stierwalt, Opt. Eng. 13, G115 (1974).
  2. D. L. Stierwalt, in Infrared Thin Films, R. P. Shimshock, ed., Vol. 39 of SPIE Critical Reviews (Society of Photo-Optical Instrumentation Engineers, Bellingham, Wash., 1991), p. 181.
  3. T. W. Merritt, J. V. Gavin, C. A. Burke, Proc. Soc. Photo-Opt. Instrum. Eng. 308, 45 (1981).
  4. K. L. Eckerle, J. J. Hsia, K. D. Mielenz, V. R. Weidner, NBS Measurement Services: Regular Spectral Transmittance, NBS Spec. Pub. 250–6 (1987).
  5. A. L. Migdall, B. Roop, G. J. Xai, Metrologia 28, 217 (1991). [CrossRef]
  6. A. L. Migdall, A. Frenkel, D. E. Kelleher, J. Res. Natl. Inst. Stand. Technol. 98, 691 (1993).
  7. D. A. C. Compton, J. Drab, H. S. Barr, Appl. Opt. 29, 1908 (1990). [CrossRef]
  8. D. B. Chase, Appl. Spectrosc. 38, 491 (1984). [CrossRef]
  9. T. Hirschfeld, in Fourier Transform Infrared Spectroscopy, J. R. Ferraro, L. J. Basile, eds. (Academic, New York, 1979), Vol. 2, Chap. 6, pp. 193–242.
  10. A. Frenkel, Z. M. Zhang, Opt. Lett. 19,1495 (1994). [CrossRef] [PubMed]
  11. Trade names and company products that are mentioned in the text or identified in an illustration are only to specify adequately the experimental procedure and equipment used. In no case does such identification imply recommendation or endorsement by the National Institute of Standards and Technology, nor does it imply that the products are necessarily the best available for the purpose.
  12. H. A. MacLeod, Thin-Film Optical Filters (Hilger, London, 1969), Chap. 7, pp. 154–199.
  13. A. Thelen, Design of Optical Interference Coatings (McGraw-Hill, New York, 1989), Chap. 10, pp. 197–217.
  14. M. I. Flik, Z. M. Zhang, J. Quant. Spectrosc. Radiat. Transfer 47, 293 (1992). [CrossRef]

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