Soft-x-ray interferometer for single-shot laser linewidth measurements
Optics Letters, Vol. 21, Issue 13, pp. 955-957 (1996)
http://dx.doi.org/10.1364/OL.21.000955
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Abstract
A soft-x-ray Mach-Zehnder interferometer configuration that makes use of the time delay introduced by diffraction gratings to conduct single-shot measurements of the linewidth of soft-x-ray laser amplifiers is proposed and analyzed. The scheme was experimentally demonstrated in the near-IR region of the spectrum by measurement of the mode separation of a semiconductor laser. A symmetric configuration with compensated time delays that can be implemented for plasma diagnostics and for evaluating soft-x-ray optics is also discussed.
© 1996 Optical Society of America
Citation
Juan L. A. Chilla, Jorge J. Rocca, Oscar E. Martinez, and Mario C. Marconi, "Soft-x-ray interferometer for single-shot laser linewidth measurements," Opt. Lett. 21, 955-957 (1996)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-21-13-955
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