We have developed a novel method of time-of-flight (TOF) photoelectron spectroscopy that permits observation of multiphoton ionizations with extremely high precision, especially for low-probability events. By scanning the laser-produced ionization region across a pinhole we can select specific laser peak intensities. The volumes occupied by low intensities rise rapidly compared with traditional straight TOF spectroscopy, resulting in high signal gains. This technique presents a new way of observing fundamental laser–matter interactions.
© 1996 Optical Society of America
Original Manuscript: March 18, 1996
Published: August 15, 1996
Peter Hansch and Linn D. Van Woerkom, "High-precision intensity-selective observation of multiphoton ionization: a new method of photoelectron spectroscopy," Opt. Lett. 21, 1286-1288 (1996)