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Optics Letters

Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

  • Vol. 21, Iss. 16 — Aug. 15, 1996
  • pp: 1286–1288

High-precision intensity-selective observation of multiphoton ionization: a new method of photoelectron spectroscopy

Peter Hansch and Linn D. Van Woerkom  »View Author Affiliations


Optics Letters, Vol. 21, Issue 16, pp. 1286-1288 (1996)
http://dx.doi.org/10.1364/OL.21.001286


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Abstract

We have developed a novel method of time-of-flight (TOF) photoelectron spectroscopy that permits observation of multiphoton ionizations with extremely high precision, especially for low-probability events. By scanning the laser-produced ionization region across a pinhole we can select specific laser peak intensities. The volumes occupied by low intensities rise rapidly compared with traditional straight TOF spectroscopy, resulting in high signal gains. This technique presents a new way of observing fundamental laser–matter interactions.

© 1996 Optical Society of America

History
Original Manuscript: March 18, 1996
Published: August 15, 1996

Citation
Peter Hansch and Linn D. Van Woerkom, "High-precision intensity-selective observation of multiphoton ionization: a new method of photoelectron spectroscopy," Opt. Lett. 21, 1286-1288 (1996)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-21-16-1286

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