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Optics Letters

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  • Vol. 21, Iss. 17 — Sep. 1, 1996
  • pp: 1315–1317

Infrared-reflection-mode near-field microscopy using an apertureless probe with a resolution of λ/600

A. Lahrech, R. Bachelot, P. Gleyzes, and A. C. Boccara  »View Author Affiliations


Optics Letters, Vol. 21, Issue 17, pp. 1315-1317 (1996)
http://dx.doi.org/10.1364/OL.21.001315


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Abstract

We report a near-field optical microscopy experiment at λ = 10.6 μm, using an apertureless metallic tip functioning simultaneously in the atomic force microscopy tapping mode. The 17-nm optical resolution (λ/600) that we achieved confirms the validity and the potential of this concept for numerous applications.

© 1996 Optical Society of America

History
Original Manuscript: March 5, 1996
Published: September 1, 1996

Citation
A. Lahrech, R. Bachelot, P. Gleyzes, and A. C. Boccara, "Infrared-reflection-mode near-field microscopy using an apertureless probe with a resolution of λ/600," Opt. Lett. 21, 1315-1317 (1996)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-21-17-1315


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