Self-trapping of planar optical beams by use of the photorefractive effect in InP:Fe
Optics Letters, Vol. 21, Issue 17, pp. 1333-1335 (1996)
http://dx.doi.org/10.1364/OL.21.001333
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Abstract
We demonstrate what we believe to be the first experimental observation of self-trapping and self-deflection of a planar optical beam by the photorefractive effect in a semiconductor. The semiconductor material is indium phosphide doped with iron. We show that the observed focusing and defocusing effects follow the component of the two-wave-mixing space charge field that is in phase with the intensity pattern, whereas the spatial beam deflection effects follow the 90°-shifted component.
© 1996 Optical Society of America
Citation
M. Chauvet, S. A. Hawkins, G. J. Salamo, M. Segev, D. F. Bliss, and G. Bryant, "Self-trapping of planar optical beams by use of the photorefractive effect in InP:Fe," Opt. Lett. 21, 1333-1335 (1996)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-21-17-1333
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