GeO2–SiO2 thin glass films were prepared by the rf sputtering deposition method. Changes in the refractive index of −3% and in the volume of 118% were induced in the film by irradiation with excimer-laser pulses. Bragg gratings a (periodic surface-relief pattern with a sinusoidal wave) have been written in the film by irradiation through a phase mask.
© 1996 Optical Society of America
Original Manuscript: February 5, 1995
Published: September 1, 1996
J. Nishii, H. Hosono, H. Kawazoe, and H. Yamanaka, "Preparation of Bragg gratings in sputter-deposited GeO2–SiO2 glasses by excimer-laser irradiation," Opt. Lett. 21, 1360-1362 (1996)