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Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

  • Vol. 21, Iss. 17 — Sep. 1, 1996
  • pp: 1363–1365

Increasing resistivity effects in field-assisted ion exchange for planar optical waveguide fabrication

Xesús Prieto and Jesús Liñares  »View Author Affiliations


Optics Letters, Vol. 21, Issue 17, pp. 1363-1365 (1996)
http://dx.doi.org/10.1364/OL.21.001363


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Abstract

An improved description of the usual field-assisted ion-exchange processes for fabricating planar surface optical waveguides in glass substrates is presented that takes into account both increased resistivity because of incoming ions and the substrate's finite thickness. Time dependencies of the ion flux density, effective depth, and profile shape are predicted.

© 1996 Optical Society of America

History
Original Manuscript: February 27, 1996
Published: September 1, 1996

Citation
Xesús Prieto and Jesús Liñares, "Increasing resistivity effects in field-assisted ion exchange for planar optical waveguide fabrication," Opt. Lett. 21, 1363-1365 (1996)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-21-17-1363


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References

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  5. X. Prieto, R. Srivastava, J. Linares, C. Montero, Opt. Mater. 5, 145 (1996). [CrossRef]
  6. S. Honkanen, Introduction to Glass Integrated Optics,S. I. Najafi, ed. (Artech, London, 1992), Chap. 3.
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  9. J. Albert, in Introduction to Glass Integrated Optics, S. I. Najafi, ed. (Artech, London, 1992), Chap. 2.

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