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Optics Letters

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  • Vol. 21, Iss. 18 — Sep. 15, 1996
  • pp: 1487–1489

Molecular engineering of polymer films for amplitude and phase measurements of Ti:sapphire femtosecond pulses

D. R. Yankelevich, Philippe Prêtre, A. Knoesen, G. Taft, M. M. Murnane, H. C. Kapteyn, and R. J. Twieg  »View Author Affiliations


Optics Letters, Vol. 21, Issue 18, pp. 1487-1489 (1996)
http://dx.doi.org/10.1364/OL.21.001487


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Abstract

Using second-harmonic frequency-resolved optical gating and a tricyanovinylaniline polymer thin film, we have measured the amplitude and the phase of mode-locked Ti:sapphire laser pulses as short as 13 fs. These thin films are ideally suited for ultrashort-pulse diagnostics because they eliminate the angle tuning associated with birefringent phase-matched crystals, minimize pulse distortions introduced by group-velocity dispersion, and exhibit excellent photochemical stability.

© 1996 Optical Society of America

History
Original Manuscript: February 20, 1996
Published: September 15, 1996

Citation
D. R. Yankelevich, G. Taft, R. J. Twieg, M. M. Murnane, Philippe Prêtre, A. Knoesen, and H. C. Kapteyn, "Molecular engineering of polymer films for amplitude and phase measurements of Ti:sapphire femtosecond pulses," Opt. Lett. 21, 1487-1489 (1996)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-21-18-1487


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