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Optics Letters

Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

  • Vol. 21, Iss. 19 — Oct. 1, 1996
  • pp: 1541–1543

Modulation Z-scan technique for characterization of photorefractive crystals

P. A. Marquez Aguilar, J. J. Sanchez Mondragon, and S. Stepanov  »View Author Affiliations


Optics Letters, Vol. 21, Issue 19, pp. 1541-1543 (1996)
http://dx.doi.org/10.1364/OL.21.001541


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Abstract

We propose a simple single-beam configuration for characterization of the amplitude, speed of growth, and polarization properties of the photoinduced refractive-index change that is due to a drift photorefractive mechanism of nonlinearity in crystals, namely, the modulation Z-scan technique, based on the modulation of an externally applied electric field. The results of a simple theoretical model developed for one-dimensional parabolic photorefractive lens formation in this configuration are illustrated by original experiments with a semi-insulating GaAs crystal at λ = 1.06 μm.

© 1996 Optical Society of America

History
Original Manuscript: March 27, 1996
Published: October 1, 1996

Citation
P. A. Marquez Aguilar, J. J. Sanchez Mondragon, and S. Stepanov, "Modulation Z-scan technique for characterization of photorefractive crystals," Opt. Lett. 21, 1541-1543 (1996)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-21-19-1541

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