We propose a simple single-beam configuration for characterization of the amplitude, speed of growth, and polarization properties of the photoinduced refractive-index change that is due to a drift photorefractive mechanism of nonlinearity in crystals, namely, the modulation Z-scan technique, based on the modulation of an externally applied electric field. The results of a simple theoretical model developed for one-dimensional parabolic photorefractive lens formation in this configuration are illustrated by original experiments with a semi-insulating GaAs crystal at λ -1.06 µm.
© 1996 Optical Society of America
P. A. Marquez Aguilar, J. J. Sanchez Mondragon, and S. Stepanov, "Modulation Z-scan technique for characterization of photorefractive crystals," Opt. Lett. 21, 1541-1543 (1996)