We propose a picosecond single-beam open Z-scan experiment in which the usual apertured detection scheme is replaced by a two-dimensional single-shot CCD camera. This enables us to extract the two-dimensional transverse modifications of the whole far-field pattern that are due to nonlinear refraction as well as to measure the induced nonlinear phase shift with increased sensitivity compared with that of the conventional Z scan.
© 1996 Optical Society of America
Original Manuscript: April 24, 1995
Published: January 15, 1996
A. Marcano O., H. Maillotte, D. Gindre, and D. Métin, "Picosecond nonlinear refraction measurement in single-beam open Z scan by charge-coupled device image processing," Opt. Lett. 21, 101-103 (1996)