Picosecond nonlinear refraction measurement in single-beam open Z scan by charge-coupled device image processing
Optics Letters, Vol. 21, Issue 2, pp. 101-103 (1996)
http://dx.doi.org/10.1364/OL.21.000101
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Abstract
We propose a picosecond single-beam open Z-scan experiment in which the usual apertured detection scheme is replaced by a two-dimensional single-shot CCD camera. This enables us to extract the two-dimensional transverse modifications of the whole far-f ield pattern that are due to nonlinear refraction as well as to measure the induced nonlinear phase shift with increased sensitivity compared with that of the conventional Z scan.
© 1996 Optical Society of America
Citation
A. Marcano O., H. Maillotte, D. Gindre, and D. Métin, "Picosecond nonlinear refraction measurement in single-beam open Z scan by charge-coupled device image processing," Opt. Lett. 21, 101-103 (1996)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-21-2-101
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