Ultrafast dark-field interferometric microscopic reflectometry
Optics Letters, Vol. 21, Issue 20, pp. 1682-1684 (1996)
http://dx.doi.org/10.1364/OL.21.001682
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Abstract
A new method of ultrafast dark-field correlation interferometry from reflective microscopic objects is described. A 120-fs single-shot registration is achieved with a dynamic range of >35 dB, a sensitivity of <-50 dB, and a resolution of 15 mm. To demonstrate the potential of the method, we measured the thickness of single-mode fiber cladding to be 19 µm.
© 1996 Optical Society of America
Citation
I. Zeylikovich and R. R. Alfano, "Ultrafast dark-field interferometric microscopic reflectometry," Opt. Lett. 21, 1682-1684 (1996)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-21-20-1682
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