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Ultrafast dark-field interferometric microscopic reflectometry

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Abstract

A new method of ultrafast dark-field correlation interferometry from reflective microscopic objects is described. A 120-fs single-shot registration is achieved with a dynamic range of >35 dB, a sensitivity of <−50 dB, and a resolution of 15 μm. To demonstrate the potential of the method, we measured the thickness of single-mode fiber cladding to be 19 μm.

© 1996 Optical Society of America

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