A new method of ultrafast dark-field correlation interferometry from reflective microscopic objects is described. A 120-fs single-shot registration is achieved with a dynamic range of >35 dB, a sensitivity of <−50 dB, and a resolution of 15 μm. To demonstrate the potential of the method, we measured the thickness of single-mode fiber cladding to be 19 μm.
© 1996 Optical Society of America
Original Manuscript: April 30, 1996
Published: October 15, 1996
I. Zeylikovich and R. R. Alfano, "Ultrafast dark-field interferometric microscopic reflectometry," Opt. Lett. 21, 1682-1684 (1996)