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Optics Letters

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  • Vol. 21, Iss. 4 — Feb. 15, 1996
  • pp: 236–238

Nonglobal model for a near-field scanning optical microscope using diffraction of the optical near field

K. Jang and W. Jhe  »View Author Affiliations


Optics Letters, Vol. 21, Issue 4, pp. 236-238 (1996)
http://dx.doi.org/10.1364/OL.21.000236


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Abstract

Diffraction of the localized optical near field by a subwavelength-sized probe (metallic circular aperture) is studied by a nonglobal approach. The problem is closely relevant to the basic principle of a near-field scanning optical microscope (NSOM). We obtain analytic expressions of the diffracted far field from which the transfer function of the NSOM can be calculated. In particular, we find a resonance enhancement in the detection efficiency when the sample size is similar to the probe size. By lateral scanning of the aperture position at a constant height, we also obtain a NSOM image of a dielectric sphere sample.

© 1996 Optical Society of America

History
Original Manuscript: September 22, 1995
Published: February 15, 1996

Citation
K. Jang and W. Jhe, "Nonglobal model for a near-field scanning optical microscope using diffraction of the optical near field," Opt. Lett. 21, 236-238 (1996)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-21-4-236


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References

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  2. J. D. JacksonClassical Electrodynamics, 2nd ed. (Wiley, New York, 1975), Chaps. 9 and 16.
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  11. H. Hori, S. Jiang, M. Ohtsu, H. Ohsawain Technical Digest of the 18th International Quantum Electronics Conference (1992), p. 48.

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