Near-field photodetection optical microscopy (NPOM) is a fundamentally new approach to near-field optical microscopy. This scanning-probe technique uses a nanometer-scale photodiode detector as a near-field optical probe. We have fabricated probes for NPOM that have optically sensitive areas as small as 100 nm × 100 nm. These new NPOM probes have been employed to image light transmitted through holes in an aluminum film. Near-surface optical interference is observed near defects and edges of the aluminum film. The optical edge response is shown to be of the order of 100 nm.
© 1996 Optical Society of America
Original Manuscript: September 14, 1995
Published: April 1, 1996
R. C. Davis, P. Neuzil, and C. C. Williams, "Optical intensity mapping on the nanometer scale by near-field photodetection optical microscopy," Opt. Lett. 21, 447-449 (1996)