We demonstrate an apparatus for measuring time-dependent x-ray diffraction. X-ray pulses from a synchrotron are diffracted by a pair of Si(111) crystals and detected with an x-ray streak camera that has single-shot resolution of better than 1 ps. The streak camera is driven by a photoconductive switch, which is triggered by 100-fs laser pulses at a repetition rate of 1 kHz. The laser and the streak camera are synchronized with the synchrotron pulses. In the averaging mode, trigger jitter results in 2-ps temporal resolution. We measured the duration of 5-keV pulses from the Advanced Light Source synchrotron to be 70ps.
© 1997 Optical Society of America
J. Larsson, Z. Chang, E. Judd, P. J. Schuck, R. W. Falcone, P. A. Heimann, H. A. Padmore, H. C. Kapteyn, P. H. Bucksbaum, M. M. Murnane, R. W. Lee, A. Machacek, J. S. Wark, X. Liu, and B. Shan, "Ultrafast x-ray diffraction using a streak-camera detector in averaging mode," Opt. Lett. 22, 1012-1014 (1997)