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Optics Letters

Optics Letters

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  • Vol. 22, Iss. 2 — Jan. 15, 1997
  • pp: 120–122

Use of a scanning near-field optical microscope architecture to study fluorescence and energy transfer near a metal

Thierry Pagnot, Dominique Barchiesi, Daniel Van Labeke, and Christian Pieralli  »View Author Affiliations


Optics Letters, Vol. 22, Issue 2, pp. 120-122 (1997)
http://dx.doi.org/10.1364/OL.22.000120


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Abstract

Fluorescence intensity depends strongly on the distance between the emitting molecule and a metallic interface. We show that a scanning near-field optical microscope (SNOM) is a simple and versatile tool for studying such an effect. The fluorescent molecules are embedded in a layer upon a silica substrate, and metal is coated on the SNOM tip. We present variations of fluorescence intensity versus tip–sample distance from 800 to ~80 nm . A simple model is used to explain the experimental results. The proposed setup could be used to study nonradiative transfer at a nanometric scale. It could also yield to a new type of optical near-field profiler that uses fluorescent signal.

© 1997 Optical Society of America

Citation
Thierry Pagnot, Dominique Barchiesi, Daniel Van Labeke, and Christian Pieralli, "Use of a scanning near-field optical microscope architecture to study fluorescence and energy transfer near a metal," Opt. Lett. 22, 120-122 (1997)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-22-2-120


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