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Optics Letters

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  • Vol. 22, Iss. 23 — Dec. 1, 1997
  • pp: 1745–1747

Optical and nonlinear optical study of KTa0.52 Nb0.48 O3 epitaxial film

H. Y. Zhang, X. H. He, Y. H. Shih, K. S. Harshavardhan, and L. A. Knauss  »View Author Affiliations


Optics Letters, Vol. 22, Issue 23, pp. 1745-1747 (1997)
http://dx.doi.org/10.1364/OL.22.001745


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Abstract

The second-order nonlinear optical coefficients d33 , d31 , and d15 of KTa0.52 Nb0.48 O3 epitaxial thin films grown upon MgO were studied by the standard Maker fringe method of an anisotropic medium. The measured d33=-84pm/V is 2.8 times the d33 of LiNbO3. The refractive indices ne and no at several wavelengths were determined by TE and TM waveguide mode measurements. The data presented here point out the excellent qualities of KTa1-x NbxO 3 films for use in integrated optics applications.

© 1997 Optical Society of America

Citation
H. Y. Zhang, X. H. He, Y. H. Shih, K. S. Harshavardhan, and L. A. Knauss, "Optical and nonlinear optical study of KTa0.52 Nb0.48 O3 epitaxial film," Opt. Lett. 22, 1745-1747 (1997)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-22-23-1745


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