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Optics Letters

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  • Vol. 22, Iss. 23 — Dec. 1, 1997
  • pp: 1808–1810

Measurement of the optical functions of uniaxial materials by two-modulator generalized ellipsometry: rutile (TiO2)

G. E. Jellison, Jr., F. A. Modine, and L. A. Boatner  »View Author Affiliations


Optics Letters, Vol. 22, Issue 23, pp. 1808-1810 (1997)
http://dx.doi.org/10.1364/OL.22.001808


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Abstract

Two-modulator generalized ellipsometry is applied to determination of the optical functions of uniaxial rutile. For a nondepolarizing sample the two-modulator generalized ellipsometer determines all the elements of the normalized Jones matrix with one measurement and thereby totally characterizes light reflecting from the sample. If a uniaxial crystal is appropriately aligned, then determining its optical functions requires only a single measurement. We have used this new instrument to obtain optical functions of rutile that are the most accurate available for optical energies above the band edge.

© 1997 Optical Society of America

Citation
G. E. Jellison, Jr., F. A. Modine, and L. A. Boatner, "Measurement of the optical functions of uniaxial materials by two-modulator generalized ellipsometry: rutile (TiO2)," Opt. Lett. 22, 1808-1810 (1997)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-22-23-1808


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