We have developed a simple, wide-optical-bandwidth, high-resolution system for performing rapid optical frequency domain reflectometry measurements and applied it to multidimensional tomographic imaging. The source is a grating-tuned external cavity semiconductor laser with a tuning capability of 25 nm in 100 ms. We discuss system performance and show a two-dimensional optical coherence tomography image of a thin glass sandwich structure as a preliminary demonstration of the systems depth and resolution capabilities.
© 1997 Optical Society of America
S. R. Chinn, E. A. Swanson, and J. G. Fujimoto, "Optical coherence tomography using a frequency-tunable optical source," Opt. Lett. 22, 340-342 (1997)