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Optics Letters

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  • Vol. 23, Iss. 11 — Jun. 1, 1998
  • pp: 858–860

Measurement of cross-phase modulation in optical materials through the direct measurement of the optical phase change

G. Rodriguez and A. J. Taylor  »View Author Affiliations


Optics Letters, Vol. 23, Issue 11, pp. 858-860 (1998)
http://dx.doi.org/10.1364/OL.23.000858


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Abstract

We measure the cross-phase modulation (XPM) nonlinear indices of optical materials resulting from the interaction of an ultrashort pump pulse at 800 nm with a weak ultrashort probe pulse at 400 nm through the direct measurement of the optical phase change, using frequency-resolved optical gating. The materials studied include fused silica (SiO2) , borosilicate glass (BK-7), β-BBO , and KD*P . This method results in a XPM nonlinear index that is in agreement with calculations based on nonlinear indices from previous self-phase modulation measurements.

© 1998 Optical Society of America

OCIS Codes
(120.5060) Instrumentation, measurement, and metrology : Phase modulation
(160.4670) Materials : Optical materials
(160.4760) Materials : Optical properties
(190.4400) Nonlinear optics : Nonlinear optics, materials
(190.7110) Nonlinear optics : Ultrafast nonlinear optics
(320.7110) Ultrafast optics : Ultrafast nonlinear optics

Citation
G. Rodriguez and A. J. Taylor, "Measurement of cross-phase modulation in optical materials through the direct measurement of the optical phase change," Opt. Lett. 23, 858-860 (1998)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-23-11-858


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