Measurement of cross-phase modulation in optical materials through the direct measurement of the optical phase change
Optics Letters, Vol. 23, Issue 11, pp. 858-860 (1998)
http://dx.doi.org/10.1364/OL.23.000858
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Abstract
We measure the cross-phase modulation (XPM) nonlinear indices of optical materials resulting from the interaction of an ultrashort pump pulse at 800 nm with a weak ultrashort probe pulse at 400 nm through the direct measurement of the optical phase change, using frequency-resolved optical gating. The materials studied include fused silica (SiO2) , borosilicate glass (BK-7), β-BBO , and KD*P . This method results in a XPM nonlinear index that is in agreement with calculations based on nonlinear indices from previous self-phase modulation measurements.
© 1998 Optical Society of America
[America ]
OCIS Codes
(120.5060) Instrumentation, measurement, and metrology : Phase modulation
(160.4670) Materials : Optical materials
(160.4760) Materials : Optical properties
(190.4400) Nonlinear optics : Nonlinear optics, materials
(190.7110) Nonlinear optics : Ultrafast nonlinear optics
(320.7110) Ultrafast optics : Ultrafast nonlinear optics
Citation
G. Rodriguez and A. J. Taylor, "Measurement of cross-phase modulation in optical materials through the direct measurement of the optical phase change," Opt. Lett. 23, 858-860 (1998)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-23-11-858
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