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Optics Letters

Optics Letters

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  • Vol. 23, Iss. 14 — Jul. 15, 1998
  • pp: 1075–1077

Mueller matrix for characterization of one-dimensional rough perfectly reflecting surfaces in a conical configuration

R. E. Luna, S. E. Acosta-Ortiz, and L.-F. Zou  »View Author Affiliations


Optics Letters, Vol. 23, Issue 14, pp. 1075-1077 (1998)
http://dx.doi.org/10.1364/OL.23.001075


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Abstract

Theoretical results of the use of a Mueller matrix to characterize a one-dimensional rough perfectly reflecting, single-scattering surface in a conical configuration are presented. The conical Mueller matrix (CMM) is derived from the known Mueller matrix of this kind of surface in the plane of incidence [the plane Mueller matrix (PMM)]. The key argument is that, as the PMM is considered to be a Mueller–Jones matrix, an appropriate rotation of the complex amplitude matrix provides the conic Mueller matrix.

© 1998 Optical Society of America

OCIS Codes
(120.5410) Instrumentation, measurement, and metrology : Polarimetry
(260.5430) Physical optics : Polarization
(290.5880) Scattering : Scattering, rough surfaces

Citation
R. E. Luna, S. E. Acosta-Ortiz, and L.-F. Zou, "Mueller matrix for characterization of one-dimensional rough perfectly reflecting surfaces in a conical configuration," Opt. Lett. 23, 1075-1077 (1998)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-23-14-1075

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