Theoretical results of the use of a Mueller matrix to characterize a one-dimensional rough perfectly reflecting, single-scattering surface in a conical configuration are presented. The conical Mueller matrix (CMM) is derived from the known Mueller matrix of this kind of surface in the plane of incidence [the plane Mueller matrix (PMM)]. The key argument is that, as the PMM is considered to be a Mueller–Jones matrix, an appropriate rotation of the complex amplitude matrix provides the conic Mueller matrix.
© 1998 Optical Society of America
R. E. Luna, *S. E. Acosta-Ortiz, and L.-F. Zou, "Mueller matrix for characterization of one-dimensional rough perfectly reflecting surfaces in a conical configuration," Opt. Lett. 23, 1075-1077 (1998)