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Optics Letters

Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

  • Vol. 23, Iss. 18 — Sep. 15, 1998
  • pp: 1420–1422

Simultaneous measurements of three-dimensional reflectivity distributions in scattering media based on optical frequency-domain reflectometry

Hajime Hiratsuka, Eiji Kido, and Takeaki Yoshimura  »View Author Affiliations


Optics Letters, Vol. 23, Issue 18, pp. 1420-1422 (1998)
http://dx.doi.org/10.1364/OL.23.001420


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Abstract

A new type of tomography system based on optical frequency-domain reflectometry is presented. Using an area sensor, the system can simultaneously measure three-dimensional reflectivity distributions in scattering media without the need for mechanical scanning. In preliminary experiments we demonstrate that a target (resolution chart) placed behind biological tissue can be imaged with high depth resolution (47 µm) for a short measurement time.

© 1998 Optical Society of America

OCIS Codes
(110.4500) Imaging systems : Optical coherence tomography
(110.6880) Imaging systems : Three-dimensional image acquisition
(170.1650) Medical optics and biotechnology : Coherence imaging
(170.4500) Medical optics and biotechnology : Optical coherence tomography

Citation
Hajime Hiratsuka, Eiji Kido, and Takeaki Yoshimura, "Simultaneous measurements of three-dimensional reflectivity distributions in scattering media based on optical frequency-domain reflectometry," Opt. Lett. 23, 1420-1422 (1998)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-23-18-1420

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