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Optics Letters

Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

  • Vol. 23, Iss. 18 — Sep. 15, 1998
  • pp: 1429–1431

Nonlinear ellipsometric method for measuring second-order cascaded phase shift

Hong-Ki Kim and Myoungsik Cha  »View Author Affiliations


Optics Letters, Vol. 23, Issue 18, pp. 1429-1431 (1998)
http://dx.doi.org/10.1364/OL.23.001429


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Abstract

An ellipsometric method for measuring second-order cascaded phase shift is experimentally demonstrated in a KNbO3 single crystal. We analyze the polarization state composed of the two orthogonal polarizations of the transmitted fundamental wave, one of which experiences intensity-dependent depletion and phase shift while the other does not. This method does not require a well-defined beam profile or interferometric stability.

© 1998 Optical Society of America

OCIS Codes
(120.2130) Instrumentation, measurement, and metrology : Ellipsometry and polarimetry
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(160.2260) Materials : Ferroelectrics
(190.4410) Nonlinear optics : Nonlinear optics, parametric processes
(190.4720) Nonlinear optics : Optical nonlinearities of condensed matter
(190.5940) Nonlinear optics : Self-action effects

Citation
Hong-Ki Kim and Myoungsik Cha, "Nonlinear ellipsometric method for measuring second-order cascaded phase shift," Opt. Lett. 23, 1429-1431 (1998)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-23-18-1429

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