Amplitude and phase characterization of 4.5-fs pulses by frequency-resolved optical gating
Optics Letters, Vol. 23, Issue 18, pp. 1474-1476 (1998)
http://dx.doi.org/10.1364/OL.23.001474
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Abstract
The technique of second-harmonic generation frequency-resolved optical gating is applied to measure the intensity and the phase of 4.5-fs pulses resulting from the fiber-compressed output of a cavity-dumped Ti:sapphire laser. Characterization of even shorter optical pulses by this method should also be feasible.
© 1998 Optical Society of America
OCIS Codes
(320.2250) Ultrafast optics : Femtosecond phenomena
(320.7100) Ultrafast optics : Ultrafast measurements
(320.7110) Ultrafast optics : Ultrafast nonlinear optics
Citation
Andrius Baltuška, Maxim S. Pshenichnikov, and Douwe A. Wiersma, "Amplitude and phase characterization of 4.5-fs pulses by frequency-resolved optical gating," Opt. Lett. 23, 1474-1476 (1998)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-23-18-1474
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