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Optics Letters

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  • Vol. 23, Iss. 19 — Oct. 1, 1998
  • pp: 1544–1546

Beam-quality measurement of a focused high-order harmonic beam

L. Le Déroff, P. Salières, and B. Carré  »View Author Affiliations


Optics Letters, Vol. 23, Issue 19, pp. 1544-1546 (1998)
http://dx.doi.org/10.1364/OL.23.001544


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Abstract

Using a multilayer spherical mirror, we focus the high-order harmonic radiation produced near 55 nm by the nonlinear interaction of an intense femtosecond laser pulse and a xenon gas jet. The focused XUV beam is characterized by a knife-edge technique in the focal region and by far-field imaging. We show that good-quality beams, nearly two times diffraction limited, can be generated, a conclusion that is at variance with recent predictions of harmonic phase-front distortion. Spot sizes close to 10 µm are obtained, resulting in a high XUV intensity. Increasing the gas density and the length of the generating medium results in a large increase in the divergence in and degradation of the beam quality.

© 1998 Optical Society of America

OCIS Codes
(020.0020) Atomic and molecular physics : Atomic and molecular physics
(190.0190) Nonlinear optics : Nonlinear optics
(190.4160) Nonlinear optics : Multiharmonic generation
(190.4180) Nonlinear optics : Multiphoton processes
(190.7110) Nonlinear optics : Ultrafast nonlinear optics
(340.0340) X-ray optics : X-ray optics

Citation
L. Le Déroff, P. Salières, and B. Carré, "Beam-quality measurement of a focused high-order harmonic beam," Opt. Lett. 23, 1544-1546 (1998)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-23-19-1544


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