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Optics Letters

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  • Vol. 23, Iss. 4 — Feb. 15, 1998
  • pp: 247–249

High-Q measurements of fused-silica microspheres in the near infrared

D. W. Vernooy, V. S. Ilchenko, H. Mabuchi, E. W. Streed, and H. J. Kimble  »View Author Affiliations


Optics Letters, Vol. 23, Issue 4, pp. 247-249 (1998)
http://dx.doi.org/10.1364/OL.23.000247


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Abstract

Measurements of the quality factor Q≈8×109 are reported for the whispering-gallery modes (WGM's) of quartz microspheres for the wavelengths 670, 780, and 850 nm; these results correspond to finesse f≈2.2×106 . The observed independence of Q from wavelength indicates that losses for the WGM's are dominated by a mechanism other than bulk absorption in fused silica in the near infrared. Data obtained by atomic force microscopy combined with a simple model for surface scattering suggest that Q can be limited by residual surface inhomogeneities. Absorption by absorbed water can also explain why the material limit is not reached at longer wavelengths in the near infrared.

© 1998 Optical Society of America

OCIS Codes
(160.6030) Materials : Silica
(230.5750) Optical devices : Resonators
(270.0270) Quantum optics : Quantum optics

Citation
D. W. Vernooy, V. S. Ilchenko, H. Mabuchi, E. W. Streed, and H. J. Kimble, "High-Q measurements of fused-silica microspheres in the near infrared," Opt. Lett. 23, 247-249 (1998)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-23-4-247


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