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Optics Letters

Optics Letters

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  • Vol. 23, Iss. 5 — Mar. 1, 1998
  • pp: 316–318

Interference in light scattering from slightly rough dielectric layers

Yu.S. Kaganovskii, V. D. Freilikher, E. Kanzieper, Y. Nafcha, and M. Rosenbluh  »View Author Affiliations


Optics Letters, Vol. 23, Issue 5, pp. 316-318 (1998)
http://dx.doi.org/10.1364/OL.23.000316


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Abstract

The scattering of light from a slightly rough surface overlying a reflecting surface is investigated. It is shown that the long-scale component of the roughness spectrum plays a critical role in the scattering patterns obtained. The scattered interference patterns are critically dependent on small variation of the rms height of the long-scale component of the roughness. Conventional perturbation theory is found to be invalid in cases in which interference phenomena in the scattering are of importance. A model is proposed that quantitatively describes the measured angular intensity distributions.

© 1998 Optical Society of America

OCIS Codes
(240.5770) Optics at surfaces : Roughness
(260.3160) Physical optics : Interference
(290.0290) Scattering : Scattering

Citation
Yu.S. Kaganovskii, V. D. Freilikher, E. Kanzieper, Y. Nafcha, and M. Rosenbluh, "Interference in light scattering from slightly rough dielectric layers," Opt. Lett. 23, 316-318 (1998)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-23-5-316

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