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Optics Letters

Optics Letters


  • Vol. 23, Iss. 6 — Mar. 15, 1998
  • pp: 415–417

Focusing through an interface: scanning and localizing the intensity

S. H. Wiersma, T. D. Visser, and P. Török  »View Author Affiliations

Optics Letters, Vol. 23, Issue 6, pp. 415-417 (1998)

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Focusing light through an interface leads to an aberrated intensity distribution that is highly extended with a relatively low peak intensity. We present a method, using a well-chosen annular aperture, that can greatly improve the localization of the intensity about a prescribed point on the axis. Also, the intensity at that point can be increased significantly. By continuously varying the annulus radii, we can scan the intensity peak through the second medium. This localization and scanning method has possible applications in three-dimensional imaging and lithography.

© 1998 Optical Society of america

OCIS Codes
(140.5960) Lasers and laser optics : Semiconductor lasers
(230.3670) Optical devices : Light-emitting diodes
(230.5590) Optical devices : Quantum-well, -wire and -dot devices
(260.3800) Physical optics : Luminescence

S. H. Wiersma, T. D. Visser, and P. Török, "Focusing through an interface: scanning and localizing the intensity," Opt. Lett. 23, 415-417 (1998)

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  1. P. Török, P. Varga, Z. Laczik, and G. R. Booker, J. Opt. Soc. Am. A 12, 325 (1995).
  2. S. H. Wiersma and T. D. Visser, J. Opt. Soc. Am. A 13, 320 (1996).
  3. S. H. Wiersma, P. Török, T. D. Visser, and P. Varga, J. Opt. Soc. Am. A 14, 1482 (1997).
  4. V. Dhayalan, “Focusing on Electromagnetic waves,” Ph.D. dissertation (University of Bergen, Bergen, Norway, 1996).
  5. M. Born and E. Wolf, Principles of Optics, 6th ed. (Cambridge U. Press, Cambridge, 1997).

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