The effect of modulation caused by a microsphere resonator is experimentally investigated with a model system consisting of a microsphere resonator and a plane substrate. We used total internal reflection microscopy (TIRM), which is a combination of conventional optical microscopy and the total internal reflection method, and observed the intensity distribution under the resonator in the evanescent-wave incidence condition. The TIRM patterns drastically change when the wavelength of the incident beam is scanned across a resonance. The response of the system is discussed on the basis of a recent proposal of traveling-wave resonance.
© 1999 Optical Society of America
(110.0180) Imaging systems : Microscopy
(120.2440) Instrumentation, measurement, and metrology : Filters
(230.5750) Optical devices : Resonators
(260.6970) Physical optics : Total internal reflection
(350.3950) Other areas of optics : Micro-optics
H. Ishikawa, H. Tamaru, and K. Miyano, "Observation of a modulation effect caused by a microsphere resonator strongly coupled to a dielectric substrate," Opt. Lett. 24, 643-645 (1999)