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  • Vol. 24, Iss. 10 — May. 15, 1999
  • pp: 643–645

Observation of a modulation effect caused by a microsphere resonator strongly coupled to a dielectric substrate

H. Ishikawa, H. Tamaru, and K. Miyano  »View Author Affiliations


Optics Letters, Vol. 24, Issue 10, pp. 643-645 (1999)
http://dx.doi.org/10.1364/OL.24.000643


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Abstract

The effect of modulation caused by a microsphere resonator is experimentally investigated with a model system consisting of a microsphere resonator and a plane substrate. We used total internal reflection microscopy (TIRM), which is a combination of conventional optical microscopy and the total internal reflection method, and observed the intensity distribution under the resonator in the evanescent-wave incidence condition. The TIRM patterns drastically change when the wavelength of the incident beam is scanned across a resonance. The response of the system is discussed on the basis of a recent proposal of traveling-wave resonance.

© 1999 Optical Society of America

OCIS Codes
(110.0180) Imaging systems : Microscopy
(120.2440) Instrumentation, measurement, and metrology : Filters
(230.5750) Optical devices : Resonators
(260.6970) Physical optics : Total internal reflection
(350.3950) Other areas of optics : Micro-optics

Citation
H. Ishikawa, H. Tamaru, and K. Miyano, "Observation of a modulation effect caused by a microsphere resonator strongly coupled to a dielectric substrate," Opt. Lett. 24, 643-645 (1999)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-24-10-643


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References

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