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Optics Letters

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  • Vol. 24, Iss. 13 — Jul. 1, 1999
  • pp: 905–907

Determination of interferometer phase distributions by use of wavelets

L. R. Watkins, S. M. Tan, and T. H. Barnes  »View Author Affiliations


Optics Letters, Vol. 24, Issue 13, pp. 905-907 (1999)
http://dx.doi.org/10.1364/OL.24.000905


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Abstract

A new technique for directly extracting phase gradients from two-dimensional (2-D) interferometer fringe data is presented. One finds the gradients by tracking the maximum modulus of the continuous wavelet transform of the fringe data and the phase distribution that is obtained, with a small error, by integration. Problems associated with phase unwrapping are thereby avoided. The technique is compared with standard methods, and excellent agreement is found. In common with Fourier-transform methods, the technique is capable of extracting the full 2-D phase distribution from a single image.

© 1999 Optical Society of America

OCIS Codes
(100.2650) Image processing : Fringe analysis
(100.5070) Image processing : Phase retrieval
(100.7410) Image processing : Wavelets
(120.3180) Instrumentation, measurement, and metrology : Interferometry

Citation
L. R. Watkins, S. M. Tan, and T. H. Barnes, "Determination of interferometer phase distributions by use of wavelets," Opt. Lett. 24, 905-907 (1999)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-24-13-905


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References

  1. K. Creath, in Progress in Optics, E. Wolf, ed. (Elsevier, Amsterdam, The Netherlands, 1988), Vol. 26, p. 384.
  2. M. Takeda, Indust. Metrol. 1, 79 (1990).
  3. H. Singh and J. Sirkis, Appl. Opt. 33, 5016 (1994).
  4. J. Marroquin, M. Servin, and R. Vera, Opt. Lett. 23, 238 (1998).
  5. I. Daubechies, Ten Lectures on Wavelets (Society for Industrial and Applied Mathematics, Philadelphia, Pa., 1992), Chap. 2.
  6. D. Gabor, J. Inst. Electr. Eng. 93, 429 (1946).
  7. W. Press, S. Teukolsky, W. Vetterling, and B. Flannery, Numerical Recipes in FORTRAN, 2nd ed. (Cambridge U. Press, Cambridge, 1992), Chap. 13.

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