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Optics Letters

Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

  • Vol. 24, Iss. 14 — Jul. 15, 1999
  • pp: 954–956

Subdiffraction resolution in far-field fluorescence microscopy

Thomas A. Klar and Stefan W. Hell  »View Author Affiliations


Optics Letters, Vol. 24, Issue 14, pp. 954-956 (1999)
http://dx.doi.org/10.1364/OL.24.000954


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Abstract

We overcame the resolution limit of scanning far-field fluorescence microscopy by disabling the fluorescence from the outer part of the focal spot. Whereas a near-UV pulse generates a diffraction-limited distribution of excited molecules, a spatially offset pulse quenches the excited molecules from the outer part of the focus through stimulated emission. This results in a subdiffraction-sized effective point-spread function. For a 1.4 aperture and a 388-nm excitation wavelength spatial resolution is increased from 150 ± 8 nm to 106 ± 8 nm with a single offset beam. Superior lateral resolution is demonstrated by separation of adjacent Pyridine 2 nanocrystals that are otherwise indiscernible.

© 1999 Optical Society of America

OCIS Codes
(000.3110) General : Instruments, apparatus, and components common to the sciences
(180.2520) Microscopy : Fluorescence microscopy
(320.7150) Ultrafast optics : Ultrafast spectroscopy
(350.5730) Other areas of optics : Resolution

Citation
Thomas A. Klar and Stefan W. Hell, "Subdiffraction resolution in far-field fluorescence microscopy," Opt. Lett. 24, 954-956 (1999)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-24-14-954

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