We present the results of time-resolved interferometric measurements of the electron-density profile in a discharge-ablated capillary waveguide. We observe the development of a pronounced axial minimum in the electron-density profile with a relative depth of as much as 60% of the axial electron density. Such a profile is suitable for channeling high-intensity laser pulses.
© 1999 Optical Society of America
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(140.7240) Lasers and laser optics : UV, EUV, and X-ray lasers
(230.7370) Optical devices : Waveguides
(350.5400) Other areas of optics : Plasmas
(350.5500) Other areas of optics : Propagation
D. J. Spence, P. D. S. Burnett, and S. M. Hooker, "Measurement of the electron-density profile in a discharge-ablated capillary waveguide," Opt. Lett. 24, 993-995 (1999)