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Optics Letters

Optics Letters


  • Vol. 24, Iss. 14 — Jul. 15, 1999
  • pp: 993–995

Measurement of the electron-density profile in a discharge-ablated capillary waveguide

D. J. Spence, P. D. S. Burnett, and S. M. Hooker  »View Author Affiliations

Optics Letters, Vol. 24, Issue 14, pp. 993-995 (1999)

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We present the results of time-resolved interferometric measurements of the electron-density profile in a discharge-ablated capillary waveguide. We observe the development of a pronounced axial minimum in the electron-density profile with a relative depth of as much as 60% of the axial electron density. Such a profile is suitable for channeling high-intensity laser pulses.

© 1999 Optical Society of America

OCIS Codes
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(140.7240) Lasers and laser optics : UV, EUV, and X-ray lasers
(230.7370) Optical devices : Waveguides
(350.5400) Other areas of optics : Plasmas
(350.5500) Other areas of optics : Propagation

D. J. Spence, P. D. S. Burnett, and S. M. Hooker, "Measurement of the electron-density profile in a discharge-ablated capillary waveguide," Opt. Lett. 24, 993-995 (1999)

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