We present a scheme for the determination of the vector nature of an electric field by optical second-harmonic generation. We demonstrate the technique by mapping the two-dimensional electric-field vector of a biased transmission line structure on silicon with a spatial resolution of ~10μm .
© 1999 Optical Society of America
[Optical Society of America ]
J. I. Dadap, J. Shan, A. S. Weling, J. A. Misewich, A. Nahata, and T. F. Heinz, "Measurement of the vector character of electric fields by optical second-harmonic generation," Opt. Lett. 24, 1059-1061 (1999)