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Optics Letters

Optics Letters


  • Vol. 24, Iss. 22 — Nov. 15, 1999
  • pp: 1546–1548

Three-dimensional electric-field vector measurement with an electro-optic sensing technique

Wen-Kai Kuo, Yang-Tung Huang, and Sheng-Lung Huang  »View Author Affiliations

Optics Letters, Vol. 24, Issue 22, pp. 1546-1548 (1999)

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A new technique for three-dimensional (3D) electric-field (e-field) vector measurement is presented. Three laser beams with different propagation paths in an electro-optic (EO) crystal were used to resolve 3D components of e-field vectors. We adopted a special geometric shape of bismuth silicon oxide EO crystal so that the three beams would propagate within it. A sensitivity of 0.6 V/cm √Hz was achieved. A commercial Ansoft Maxwell 3D field simulator was also used to verify our measurements.

© 1999 Optical Society of America

OCIS Codes
(120.4290) Instrumentation, measurement, and metrology : Nondestructive testing
(120.5410) Instrumentation, measurement, and metrology : Polarimetry
(130.6010) Integrated optics : Sensors
(190.1900) Nonlinear optics : Diagnostic applications of nonlinear optics
(230.2090) Optical devices : Electro-optical devices

Wen-Kai Kuo, Yang-Tung Huang, and Sheng-Lung Huang, "Three-dimensional electric-field vector measurement with an electro-optic sensing technique," Opt. Lett. 24, 1546-1548 (1999)

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