Abstract
Crystalline Ti:sapphire thin films were grown at low temperatures upon (0001) substrates by reactive crossed-beam laser ablation at 248 nm by use of a liquid Ti–Al alloy target and . The films were investigated ex situ by x-ray diffraction, x-ray photoelectron spectroscopy, and Rutherford backscattering spectrometry. Low-temperature luminescence was identical to that for ions in bulk samples of .
© 1999 Optical Society of America
Full Article | PDF ArticleMore Like This
Fei-Peng Yu, Sin-Liang Ou, and Dong-Sing Wuu
Opt. Mater. Express 5(5) 1240-1249 (2015)
Nasir Alfaraj, Kuang-Hui Li, Laurentiu Braic, Mohamed Nejib Hedhili, Zaibing Guo, Tien Khee Ng, and Boon S. Ooi
Opt. Mater. Express 12(8) 3273-3283 (2022)
D. M. Bagnall, B. Ullrich, X. G. Qiu, Y. Segawa, and H. Sakai
Opt. Lett. 24(18) 1278-1280 (1999)