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Optics Letters

Optics Letters


  • Vol. 24, Iss. 22 — Nov. 15, 1999
  • pp: 1581–1583

Production and characterization of Ti:sapphire thin films grown by reactive laser ablation with elemental precursors

P. R. Willmott, P. Manoravi, J. R. Huber, T. Greber, Tracey A. Murray, and Keith Holliday  »View Author Affiliations

Optics Letters, Vol. 24, Issue 22, pp. 1581-1583 (1999)

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Crystalline Ti:sapphire (Ti:Al2O3) thin films were grown at low temperatures upon Al2O3 (0001) substrates by reactive crossed-beam laser ablation at 248 nm by use of a liquid Ti–Al alloy target and O2 . The films were investigated ex situ by x-ray diffraction, x-ray photoelectron spectroscopy, and Rutherford backscattering spectrometry. Low-temperature luminescence was identical to that for Ti3+ ions in bulk samples of Al2O3 .

© 1999 Optical Society of America

OCIS Codes
(140.3390) Lasers and laser optics : Laser materials processing
(230.7390) Optical devices : Waveguides, planar
(260.3800) Physical optics : Luminescence
(310.1860) Thin films : Deposition and fabrication
(310.6860) Thin films : Thin films, optical properties

P. R. Willmott, P. Manoravi, J. R. Huber, T. Greber, Tracey A. Murray, and Keith Holliday, "Production and characterization of Ti:sapphire thin films grown by reactive laser ablation with elemental precursors," Opt. Lett. 24, 1581-1583 (1999)

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  1. P. F. Moulton, J. Opt. Soc. Am. B 3, 125 (1986).
  2. A. A. Anderson, R. W. Eason, M. Jelinek, C. Grivas, D. Lane, K. Rogers, L. M. B. Hickey, and C. Fotakis, Thin Solid Films 300, 68 (1997); A. A. Anderson, R. W. Eason, L. M. B. Hickey, M. Jelinek, C. Grivas, D. S. Gill, and N. A. Vainos, Opt. Lett. 22, 1556 (1997).
  3. L.-C. Chen, in Pulsed Laser Deposition of Thin Films, D. B. Chrisey and G. K. Hubler, eds. (Wiley, New York, 1994), p. 167.
  4. J. A. Greer and H. J. van Hook, Mater. Res. Soc. Symp. Proc. 169, 463 (1990).
  5. H. Sankur, W. J. Gunning, J. DeNatale, and J. F. Flintoff, J. Appl. Phys. 65, 2475 (1989).
  6. P. R. Willmott and F. Antoni, Appl. Phys. Lett. 73, 1394 (1998).
  7. J. L. Murray and A. J. McAlister, in Binary Alloy Phase Diagrams, T. B. Massalski, ed. (American Society of Metals, Materials Park, Oh., 1986), Vol. I, p. 173; J. L. Murray, Metall. Trans. A 19, 243 (1988).
  8. P. R. Willmott, R. Timm, and J. R. Huber, J. Appl. Phys. 82, 2082 (1997).
  9. J. F. Ready, Appl. Phys. Lett. 3, 11 (1963).
  10. C. Oviedo, J. Phys. Condens. Matter 5, A153 (1993).
  11. J. T. Mayer, U. Diebold, T. E. Madey, and E. Garfunkel, J. Electron. Spectrosc. Relat. Phenom. 73, 1 (1995). See, in particular, Table 1 for a summary of XPS data on the oxidation states of Ti.
  12. B. D. Ratner and D. G. Castner, in Surface Analysis—The Principal Techniques, J. C. Vickerman, ed. (Wiley, Chichester, UK, 1997), p. 43.
  13. T. S. Bessonova, M. P. Stanislavskii, and V. Ya. Khaimov-Malkov, Opt. Spectrosc. (USSR) 41, 87 (1976).
  14. R. L. Aggarwal, A. Sanchez, M. M. Stuppi, R. E. Fahey, A. J. Strauss, W. R. Rapoport, and C. P. Khattak, IEEE J. Quantum Electron. 24, 1003 (1988).

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