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Optics Letters

Optics Letters


  • Vol. 24, Iss. 7 — Apr. 1, 1999
  • pp: 439–441

Three-dimensional optical metrology with color-coded extended depth of focus

E. Hasman, S. Keren, N. Davidson, and A. A. Friesem  »View Author Affiliations

Optics Letters, Vol. 24, Issue 7, pp. 439-441 (1999)

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A novel method of rapid three-dimensional optical metrology that is based on triangulation of a configuration of color-coded light stripes is presented. The method exploits polychromatic illumination and a combined diffractive–refractive element, so the incident light is focused upon a stripe that is axially dispersed, greatly increasing the depth-measuring range without any decrease in the axial or the lateral resolution. The discrimination of each color stripe is further improved by spectral coding and decoding techniques. An 18-fold increase in the depth of focus was experimentally obtained while diffraction-limited light stripes were completely maintained.

© 1999 Optical Society of America

E. Hasman, S. Keren, N. Davidson, and A. A. Friesem, "Three-dimensional optical metrology with color-coded extended depth of focus," Opt. Lett. 24, 439-441 (1999)

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