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Optics Letters

Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

  • Vol. 24, Iss. 9 — May. 1, 1999
  • pp: 611–613

Pupil-plane speckle imaging with a referenced polarization technique

J. K. Boger  »View Author Affiliations


Optics Letters, Vol. 24, Issue 9, pp. 611-613 (1999)
http://dx.doi.org/10.1364/OL.24.000611


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Abstract

Pupil-plane speckle imaging is demonstrated by use of a polarimeter to estimate the complex wave front from an actively illuminated target. An experimental technique, referenced polarization imaging (RPI), closely parallels optical heterodyne imaging but is easier to perform in a laboratory. Further, RPI is less sensitive to target motions than the heterodyne method. The RPI technique is described, along with experimental results.

© 1999 Optical Society of America

OCIS Codes
(040.2840) Detectors : Heterodyne
(110.6150) Imaging systems : Speckle imaging
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(120.5410) Instrumentation, measurement, and metrology : Polarimetry
(120.6150) Instrumentation, measurement, and metrology : Speckle imaging

Citation
J. K. Boger, "Pupil-plane speckle imaging with a referenced polarization technique," Opt. Lett. 24, 611-613 (1999)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-24-9-611

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