Interfacial shape and contact-angle measurement of transparent samples with confocal interference microscopy: a publisher's erratum
Optics Letters, Vol. 25, Issue 11, pp. 862-862 (2000)
http://dx.doi.org/10.1364/OL.25.000862
Acrobat PDF (128 KB)
Abstract
© 2000 Optical Society of America
[Optical Society of America ]
OCIS Codes
(120.2830) Instrumentation, measurement, and metrology : Height measurements
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.3940) Instrumentation, measurement, and metrology : Metrology
(170.1790) Medical optics and biotechnology : Confocal microscopy
(180.3170) Microscopy : Interference microscopy
Citation
David G. Fischer and Ben Ovryn, "Interfacial shape and contact-angle measurement of transparent samples with confocal interference microscopy: a publisher's erratum," Opt. Lett. 25, 862-862 (2000)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-25-11-862
You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
You do not have subscription access to this journal. Article level metrics are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
Related Journal Articles 
- Interfacial shape and contact-angle measurement of transparent samples with confocal interference microscopy (OL)
- Interferometry with optical pickups (OL)
- Polarized Differential-Phase Laser Scanning Microscope (AO)
- Dispersion Error in White-Light Linnik Interferometers and its Implications for Evaluation Procedures (AO)
- Self-calibrating lateral scanning white-light interferometer (AO)
Related Conference Papers
- Metrology for the Space Interferometry Mission
- High Sensitivity Vibration Measurements with Absolute Calibration
- Application of Frequency Combs for Precision Measurement of Refractive Index of Air
- High Flux Atom Lasers, Interferometry and the Shot Noise Limit
- Profilometry Using a Frequency-Shifted Feedback Laser
OSA is a member of 