By introduction of an optical gating beam on a semiconductor wafer, near-field terahertz (THz) imaging with a dynamic aperture has been realized. The spatial resolution is determined by the focus size of the optical gating bean and the near-field diffraction effect. THz imaging with subwavelength spatial resolution (better than 50μm) is demonstrated.
© 2000 Optical Society of America
Q. Chen, Zhiping Jiang, G. X. Xu, and X.-C. Zhang, "Near-field terahertz imaging with a dynamic aperture," Opt. Lett. 25, 1122-1124 (2000)