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Optics Letters

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  • Vol. 25, Iss. 20 — Oct. 15, 2000
  • pp: 1526–1528

Interferometric phase-dispersion microscopy

Changhuei Yang, Adam Wax, Irene Georgakoudi, Eugene B. Hanlon, Kamran Badizadegan, Ramachandra R. Dasari, and Michael S. Feld  »View Author Affiliations


Optics Letters, Vol. 25, Issue 20, pp. 1526-1528 (2000)
http://dx.doi.org/10.1364/OL.25.001526


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Abstract

We describe a new scanning microscopy technique, phase-dispersion microscopy (PDM). The technique is based on measuring the phase difference between the fundamental and the second-harmonic light in a novel interferometer. PDM is highly sensitive to subtle refractive-index differences that are due to dispersion (differential optical path sensitivity, 5 nm). We apply PDM to measure minute amounts of DNA in solution and to study biological tissue sections. We demonstrate that PDM performs better than conventional phase-contrast microscopy in imaging dispersive and weakly scattering samples.

© 2000 Optical Society of America

OCIS Codes
(040.2840) Detectors : Heterodyne
(110.0180) Imaging systems : Microscopy
(110.4500) Imaging systems : Optical coherence tomography
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(170.3880) Medical optics and biotechnology : Medical and biological imaging

Citation
Changhuei Yang, Adam Wax, Irene Georgakoudi, Eugene B. Hanlon, Kamran Badizadegan, Ramachandra R. Dasari, and Michael S. Feld, "Interferometric phase-dispersion microscopy," Opt. Lett. 25, 1526-1528 (2000)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-25-20-1526


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References

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