A generalized Radon transform is presented that relates, for the case of an evanescent wave that is incident upon a weakly scattering medium, the homogeneous components of the scattered field to the three-dimensional Fourier transform of the dielectric susceptibility. This relationship is used within the context of total internal reflection microscopy to reconstruct the depth structure of the dielectric susceptibility from simulated scattered field data.
© 2000 Optical Society of America
David G. Fischer, "Subwavelength depth resolution in near-field microscopy," Opt. Lett. 25, 1529-1531 (2000)