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Optics Letters

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  • Vol. 25, Iss. 23 — Dec. 1, 2000
  • pp: 1699–1701

Profile of a fiber from backscattering measurements

J. L. de la Peña, J. M. Saiz, and F. González  »View Author Affiliations


Optics Letters, Vol. 25, Issue 23, pp. 1699-1701 (2000)
http://dx.doi.org/10.1364/OL.25.001699


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Abstract

The angular positions of the light-scattering minima obtained from structures placed on flat substrates are closely related to the geometry of the scattering object. We show how the profile of a fiber can be determined, and possible irregularities located, by measurement of the backscattering patterns. An approximate double-interaction model is used to fit the results.

© 2000 Optical Society of America

OCIS Codes
(120.4630) Instrumentation, measurement, and metrology : Optical inspection
(120.5820) Instrumentation, measurement, and metrology : Scattering measurements
(290.1350) Scattering : Backscattering
(290.5820) Scattering : Scattering measurements

Citation
J. L. de la Peña, J. M. Saiz, and F. González, "Profile of a fiber from backscattering measurements," Opt. Lett. 25, 1699-1701 (2000)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-25-23-1699


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